وصف

The Standard Test Finger Probe meets the standards of IEC 60529, which is used for simulating the arm in the IP test. It is mainly used for IP grade test of the first characteristic number 2, and additional letter B project’s test. In the testing requirements of preventing from approaching to the hazardous parts, probe B needs 10N±3N thrust. For Other requirements, please refer to the following standards.

وفق :IEC60065, اللجنة الانتخابية المستقلة 60335-1, اللجنة الانتخابية المستقلة 60529, IEC60884-1, IEC60950, IEC61032, IEC69

طلب:
1, The joint part of The Standard Test Knurled Finger Probe can’t touch the live parts or close to the dangerous parts, و 50 mm to 20 mm baffle plate cannot enter.
2, In the prevent electric shock test, wires , power devices, and lighting devices are needed.
3,Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance

ملحوظة 1:Using the pin and groove solution is only one of the possible approaches in order to limit the bending angle to 90°. لهذا السبب, dimensions and tolerances of these details are not given in the drawing. The actual design must insure a 90° bending angle with a 0° to + 10° tolerance.
ملحوظة 2: Dimensions in parentheses are for information only.
ملحوظة 3: The test finger is taken from IEC 60950-1, Figure 2A. That test finger is based on IEC 6103216), Figure 2,test probe B. في بعض الحالات, the tolerances are different.

Knurled Finger Diameter12مم
Knurled Finger Length80مم
Baffle Plate Diameter50مم
Baffle Plate Length100مم






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