MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
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MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
Principle of instrumental
The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.
Measurement functions
Roughness analysis: رع, ر.ق, ر.ز, روبية, غ, روبية, آر إس إم, Rc, ر.ز(من), R3z, ر.ز(هو), Rpmax
Rpm, ركو, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, أ1, A2
آر إكس, AR, Rpc, Rmax, RZ-ISO, 4واحد, Ry
Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, دبليو, Wx, Wz, Wsm, Wdc, Wte
Wmr, Aw, ج(Wmr), Wmr(ج), Wdq/W△q
Original contour analysis: نقطة, بنسلفانيا, Pp, Pv, Pq, Pc, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(ج), Pz
The Pmr, ج (Pmr)
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
المواصفات الفنية
| غرض | تخصيص | ||
| نطاق القياس | X axis driver | 100مم | |
| Z1（sensor） Roughness and contour sharing | 15مم | ||
| Column height | 400مم | ||
| دقة القياس | X Axis （L=X axis Moving guide distance） | ±(0.8+0.2لتر/100)ميكرومتر | |
| Z1 Axis （H=Z1 axisd direction measure height） | ±(0.8+|0.2ح|/100)ميكرومتر | ||
| salvage value contour | ≤0.005μm | ||
| Error value | ≤±(5nm+0.1A) | ||
| Indication repeatability | ≤±3% | ||
| X axis | straightness | 0.6μm /100mm | |
| دقة | 0.01ميكرومتر | ||
| sensor | يكتب | Grating sensor | |
| دقة | 0.01ميكرومتر | ||
| Evaluate length | λc×3、4、5、6、7 | ||
| Cutoff wavelength | 0.025、0.08、0.25、0.8、2.5、8مم | ||
| Motion control | Speed of rail movement | 0.02مم–4.0مم/ثانية | |
| Measurement speed | 0.02مم– 4.0مم/ثانية | ||
