MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
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Beschreibung
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
Principle of instrumental
The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.
Measurement functions
Roughness analysis: Ra, Rq, Rz, Rp, Rt, Rsk, Rsm, Rc, Rz(AUS), R3z, Rz(ER), Rpmax
Rpm, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2
Rx, AR, Rpc, Rmax, RZ-ISO, 4eins, Ry
Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, W, Wx, Wz, Wsm, Wdc, Wte
Wmr, Aw, C(Wmr), Wmr(C), Wdq/W△q
Original contour analysis: Pt, Pa, Pp, Pv, Pq, Stk, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pr(C), Pz
Der Pmr, C (Pr)
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
Technische Spezifikation
Artikel | Spezifikation | ||
Messbereich | X-Achsen-Treiber | 100mm | |
Z1 (Sensor) Rauheits- und Konturenteilung | 15mm | ||
Säulenhöhe | 400mm | ||
Genauigkeit messen | X-Achse (L=X-Achse Bewegungsführungsabstand) | ±(0.8+0.2L/100)μm | |
Z1-Achse (H=Z1-Achsenrichtung misst die Höhe) | ±(0.8+|0.2H|/100)μm | ||
Restwertkontur | ≤0,005μm | ||
Fehlerwert | ≤±(5nm+0,1A) | ||
Wiederholbarkeit der Anzeige | ≤±3% | ||
X-Achse | Geradheit | 0.6μm/100mm | |
Auflösung | 0.01μm | ||
Sensor | Typ | Gittersensor | |
Auflösung | 0.01μm | ||
Länge auswerten | λc×3、4、5、6、7 | ||
Grenzwellenlänge | 0.025、0.08、0.25、0.8、2.5、8mm | ||
Bewegungskontrolle | Geschwindigkeit der Schienenbewegung | 0.02mm–4.0mm/s | |
Messgeschwindigkeit | 0.02mm– 4.0mm/s |