תיאור

Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe

סעיף GB16915.1 10.1 הגנה מפני התחשמלות
75N no contact test direct
The test is to meet the IEC61032 Figure 7 מִבְחָן 11, GB4943, IEC60950, GB/T16842 test 11, GB8898, GB4706, IEC60335, IEC60065, IEC60598, GB7000 and other standards. The size is the same as IEC61032 test B, without joints, used in the test to simulate fingers, mainly for the application of external forces in the case of fingers to prevent access to dangerous parts test. Configurable with 10-75N device

Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe
פרמטרים טכניים:

Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe

סעיף GB16915.1 10.1 הגנה מפני התחשמלות
75N no contact test direct
The test is to meet the IEC61032 Figure 7 מִבְחָן 11, GB4943, IEC60950, GB/T16842 test 11, GB8898, GB4706, IEC60335, IEC60065, IEC60598, GB7000 and other standards. The size is the same as IEC61032 test B, without joints, used in the test to simulate fingers, mainly for the application of external forces in the case of fingers to prevent access to dangerous parts test. Configurable with 10-75N device

Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe

סעיף GB16915.1 10.1 הגנה מפני התחשמלות
75N no contact test direct
The test is to meet the IEC61032 Figure 7 מִבְחָן 11, GB4943, IEC60950, GB/T16842 test 11, GB8898, GB4706, IEC60335, IEC60065, IEC60598, GB7000 and other standards. The size is the same as IEC61032 test B, without joints, used in the test to simulate fingers, mainly for the application of external forces in the case of fingers to prevent access to dangerous parts test. Configurable with 10-75N device

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