Descrizione

MMD-SV100 Rugosimetro da banco,Analizzatore di rugosità superficiale

Principle of instrumental

The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.

Measurement functions

Roughness analysis: RA, Rq, Rz, Rp, Rt, Rs, Rsm, Rc, Rz(DA), R3z, Rz(LUI), Rpmax

Rpm, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2

Rx, AR, Rpc, Rmax, RZ-ISO, 4uno, Ry

Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, W, Wx, Wz, Wsm, Wdc, Wte

Wmr, Aw, C(Wmr), Wmr(C), Wdq/W△q

Original contour analysis: Pt, papà, Pp, Pv, Pq, Pc, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(C), Pz

The Pmr, C (Pmr)

MMD-SV100 Rugosimetro da banco,Analizzatore di rugosità superficiale

Specifica tecnica

ArticoloSpecifica
Intervallo di misuraX axis driver100mm
Z1(sensor)

Roughness and contour sharing

15mm
Column height400mm
Measure accuracyX Axis

(L=X axis Moving guide distance)

±(0.8+0.2L/100)µm
Z1 Axis

(H=Z1 axisd direction measure height)

±(0.8+|0.2H|/100)µm
salvage value contour≤0.005μm
Error value≤±(5nm+0.1A)
Indication repeatability≤±3%
Asse Xstraightness0.6μm /100mm
risoluzione0.01µm
sensoretipoGrating sensor
risoluzione0.01µm
Evaluate lengthλc×3、4、5、6、7
Cutoff wavelength0.025、0.08、0.25、0.8、2.5、8mm
Motion controlSpeed of rail movement0.02mm–4.0mm/s
Measurement speed0.02mm– 4.0mm/s






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