粉末打錠コンパスの使用 – 300 – 粉塵サンプルの蛍光X線分析装置 P, TiV, で, 銅, 亜鉛, ガ, Rb, シニア, 注意, Cs and Ba, La, Hf, ジル, 鉛, AI2O3, CaO, Fe2O3, K2O, MgO スタイル, Na2O, amount of SiO2, such as primary and secondary component were determined and optimized the spectral lines, were using the experience coefficient method and the Compton scattering line as internal standard calibration matrix effect validated with national standard substances measured value and standard value Operator, can meet the demand of customer tests

ポータブル蛍光X線分析計 Compass300 一次および二次元素のダストを迅速分析