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- 問い合わせ
説明
Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe
GB16915.1条項 10.1 感電に対する保護
75N no contact test direct
The test is to meet the IEC61032 Figure 7 テスト 11, GB4943, IEC60950, GB/T16842 test 11, GB8898, GB4706, IEC60335, IEC60065, IEC60598, GB7000 and other standards. The size is the same as IEC61032 test B, without joints, used in the test to simulate fingers, mainly for the application of external forces in the case of fingers to prevent access to dangerous parts test. Configurable with 10-75N device
Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe
技術的パラメータ:
| 直径 | 12んん |
| Direct length | 80んん |
| バッフル径 | 50んん |
Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe
GB16915.1条項 10.1 感電に対する保護
75N no contact test direct
The test is to meet the IEC61032 Figure 7 テスト 11, GB4943, IEC60950, GB/T16842 test 11, GB8898, GB4706, IEC60335, IEC60065, IEC60598, GB7000 and other standards. The size is the same as IEC61032 test B, without joints, used in the test to simulate fingers, mainly for the application of external forces in the case of fingers to prevent access to dangerous parts test. Configurable with 10-75N device
Diameter 12MM 75N no hinged test direct finger anti-shock protection test finger Experimental probe
GB16915.1条項 10.1 感電に対する保護
75N no contact test direct
The test is to meet the IEC61032 Figure 7 テスト 11, GB4943, IEC60950, GB/T16842 test 11, GB8898, GB4706, IEC60335, IEC60065, IEC60598, GB7000 and other standards. The size is the same as IEC61032 test B, without joints, used in the test to simulate fingers, mainly for the application of external forces in the case of fingers to prevent access to dangerous parts test. Configurable with 10-75N device
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