MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
- 説明
- 問い合わせ
説明
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
Principle of instrumental
The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.
Measurement functions
Roughness analysis: ラ, Rq, Rz, ルピア, RT, Rsk, Rsm, Rc, Rz(から), R3z, Rz(彼), Rpmax
Rpm, Rku, Rdq/R△q, RδC, Mr1, Mr2, RPK, Rvk, Rk, Rdc, A1, A2
Rx, AR, Rpc, Rmax, RZ-ISO, 41つ, Ry
Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, W, Wx, Wz, Wsm, Wdc, Wte
Wmr, Aw, C(Wmr), Wmr(C), Wdq/W△q
Original contour analysis: ポイント, パ, Pp, Pv, Pq, Pc, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(C), Pz
The Pmr, C (Pmr)
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
技術仕様
アイテム | 仕様 | ||
測定範囲 | X axis driver | 100んん | |
Z1(sensor) Roughness and contour sharing | 15んん | ||
Column height | 400んん | ||
Measure accuracy | X Axis (L=X axis Moving guide distance) | ±(0.8+0.2L/100)μm | |
Z1 Axis (H=Z1 axisd direction measure height) | ±(0.8+|0.2H|/100)μm | ||
salvage value contour | ≤0.005μm | ||
Error value | ≤±(5nm+0.1A) | ||
Indication repeatability | ≤±3% | ||
X axis | straightness | 0.6μm /100mm | |
解決 | 0.01μm | ||
センサー | タイプ | Grating sensor | |
解決 | 0.01μm | ||
Evaluate length | λc×3、4、5、6、7 | ||
Cutoff wavelength | 0.025、0.08、0.25、0.8、2.5、8んん | ||
Motion control | Speed of rail movement | 0.02んん–4.0mm/s | |
Measurement speed | 0.02んん– 4.0mm/s |