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説明
ZXL-840 Separated Helium Mass Spectrometer Leak Detector for semiconductor and electronics
初め, 製品導入
1.Separate design, easy to move quickly
2.Wide detection range, large and small leakage can be detected
3.Leak detection port high pressure resistance, wide range of adaptation
4.Full LCD touch color screen
5.Leak detection state zero clear with one key
6.English and Chinese menu interface
7.The vacuum pump is easy to maintain
8.Long warranty of core parts.
ZXL-840 Separated Helium Mass Spectrometer Leak Detector for semiconductor and electronics
二, 主なテクニカル指標
ZXL-840 Separated Helium Mass Spectrometer Leak Detector for semiconductor and electronics
初め, 製品導入
1.Separate design, easy to move quickly
2.Wide detection range, large and small leakage can be detected
3.Leak detection port high pressure resistance, wide range of adaptation
4.Full LCD touch color screen
5.Leak detection state zero clear with one key
6.English and Chinese menu interface
7.The vacuum pump is easy to maintain
8.Long warranty of core parts.
ZXL-840 Separated Helium Mass Spectrometer Leak Detector for semiconductor and electronics
初め, 製品導入
1.Separate design, easy to move quickly
2.Wide detection range, large and small leakage can be detected
3.Leak detection port high pressure resistance, wide range of adaptation
4.Full LCD touch color screen
5.Leak detection state zero clear with one key
6.English and Chinese menu interface
7.The vacuum pump is easy to maintain
8.Long warranty of core parts.
ZXL-840 Separated Helium Mass Spectrometer Leak Detector for semiconductor and electronics
二, 主なテクニカル指標
ZXL-840 Separated Helium Mass Spectrometer Leak Detector for semiconductor and electronics
初め, 製品導入
1.Separate design, easy to move quickly
2.Wide detection range, large and small leakage can be detected
3.Leak detection port high pressure resistance, wide range of adaptation
4.Full LCD touch color screen
5.Leak detection state zero clear with one key
6.English and Chinese menu interface
7.The vacuum pump is easy to maintain
8.Long warranty of core parts.