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설명
MMD-SV100 탁상용 거칠기 시험기,표면 거칠기 분석기
Principle of instrumental
The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.
Measurement functions
Roughness analysis: 라, Rq, Rz, Rp, RT, Rsk, Rsm, Rc, Rz(에서), R3z, Rz(그), Rpmax
회전수, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2
Rx, AR, Rpc, R최대, RZ-ISO, 4하나, 라이
Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, 여, Wx, Wz, Wsm, Wdc, Wte
Wmr, Aw, 씨(Wmr), Wmr(씨), Wdq/W△q
Original contour analysis: 백금, 아빠, Pp, Pv, Pq, PC, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(씨), Pz
The Pmr, 씨 (Pmr)
MMD-SV100 탁상용 거칠기 시험기,표면 거칠기 분석기
기술 사양
안건 | 사양 | ||
측정 범위 | X axis driver | 100mm | |
Z1(sensor) Roughness and contour sharing | 15mm | ||
Column height | 400mm | ||
정확도 측정 | X Axis (L=X axis Moving guide distance) | ±(0.8+0.2L/100)μm | |
Z1 Axis (H=Z1 axisd direction measure height) | ±(0.8+|0.2시간|/100)μm | ||
salvage value contour | ≤0.005μm | ||
Error value | ≤±(5nm+0.1A) | ||
Indication repeatability | ≤±3% | ||
X축 | straightness | 0.6μm /100mm | |
해결 | 0.01μm | ||
감지기 | 유형 | Grating sensor | |
해결 | 0.01μm | ||
Evaluate length | λc×3、4、5、6、7 | ||
Cutoff wavelength | 0.025、0.08、0.25、0.8、2.5、8mm | ||
Motion control | Speed of rail movement | 0.02mm–4.0밀리미터/초 | |
측정 속도 | 0.02mm– 4.0밀리미터/초 |