설명

MMD-SV100 탁상용 거칠기 시험기,표면 거칠기 분석기

Principle of instrumental

The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.

Measurement functions

Roughness analysis: 라, Rq, Rz, Rp, RT, Rsk, Rsm, Rc, Rz(에서), R3z, Rz(그), Rpmax

회전수, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2

Rx, AR, Rpc, R최대, RZ-ISO, 4하나, 라이

Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, 여, Wx, Wz, Wsm, Wdc, Wte

Wmr, Aw, 씨(Wmr), Wmr(씨), Wdq/W△q

Original contour analysis: 백금, 아빠, Pp, Pv, Pq, PC, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(씨), Pz

The Pmr, 씨 (Pmr)

MMD-SV100 탁상용 거칠기 시험기,표면 거칠기 분석기

기술 사양

안건사양
측정 범위X axis driver100mm
Z1(sensor)

Roughness and contour sharing

15mm
Column height400mm
정확도 측정X Axis

(L=X axis Moving guide distance)

±(0.8+0.2L/100)μm
Z1 Axis

(H=Z1 axisd direction measure height)

±(0.8+|0.2시간|/100)μm
salvage value contour≤0.005μm
Error value≤±(5nm+0.1A)
Indication repeatability≤±3%
X축straightness0.6μm /100mm
해결0.01μm
감지기유형Grating sensor
해결0.01μm
Evaluate lengthλc×3、4、5、6、7
Cutoff wavelength0.025、0.08、0.25、0.8、2.5、8mm
Motion controlSpeed of rail movement0.02mm–4.0밀리미터/초
측정 속도0.02mm– 4.0밀리미터/초






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