Laboratoryjny tester chropowatości MMD-SV100,Analizator chropowatości powierzchni
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Opis
Laboratoryjny tester chropowatości MMD-SV100,Analizator chropowatości powierzchni
Principle of instrumental
The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.
Measurement functions
Roughness analysis: Ra, Rq, Rz, RP, Rt, rupii, RSM, Rc, Rz(Z), R3z, Rz(ON), Rpmax
Rpm, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2
Odbiór, AR, Rpc, Rmax, RZ-ISO, 4jeden, Ry
Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, W, Wx, Wz, Wsm, Wdc, Wte
Wmr, Aw, C(Wmr), Wmr(C), Wdq/W△q
Original contour analysis: Pt, Rocznie, Pp, Pv, Pq, szt, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(C), Pz
The Pmr, C (Pmr)
Laboratoryjny tester chropowatości MMD-SV100,Analizator chropowatości powierzchni
Specyfikacja techniczna
Przedmiot | Specyfikacja | ||
Zmierz zakres | X axis driver | 100mm | |
Z1(sensor) Roughness and contour sharing | 15mm | ||
Column height | 400mm | ||
Zmierz dokładność | X Axis (L=X axis Moving guide distance) | ±(0.8+0.2L/100)um | |
Z1 Axis (H=Z1 axisd direction measure height) | ±(0.8+|0.2H|/100)um | ||
salvage value contour | ≤0.005μm | ||
Wartość błędu | ≤±(5nm+0.1A) | ||
Indication repeatability | ≤±3% | ||
X axis | straightness | 0.6μm /100mm | |
rezolucja | 0.01um | ||
sensor | typ | Grating sensor | |
rezolucja | 0.01um | ||
Evaluate length | λc×3、4、5、6、7 | ||
Cutoff wavelength | 0.025、0.08、0.25、0.8、2.5、8mm | ||
Motion control | Speed of rail movement | 0.02mm–4.0mm/s | |
Prędkość pomiaru | 0.02mm– 4.0mm/s |