MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
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Description
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
Principle of instrumental
The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.
Measurement functions
Roughness analysis: Ra, Rq, Rz, Rp, Rt, Rsk, Rsm, Rc, Rz(DIN), R3z, Rz(JIS), Rpmax
Rpm, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2
Rx, AR, Rpc, Rmax, RZ-ISO, 4um, Ry
Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, W, Wx, Wz, Wsm, Wdc, Wte
Wmr, Aw, C(Wmr), Wmr(C), Wdq/W△q
Original contour analysis: Pt, Pa, Pp, Pv, Pq, Pc, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(C), Pz
The Pmr, C (Pmr)
MMD-SV100 Benchtop Roughness Tester,Surface Roughness Analyzer
Technical Specification
Item | Specification | ||
Measure range | X axis driver | 100mm | |
Z1(sensor) Roughness and contour sharing | 15mm | ||
Column height | 400mm | ||
Measure accuracy | X Axis (L=X axis Moving guide distance) | ±(0.8+0.2L/100)μm | |
Z1 Axis (H=Z1 axisd direction measure height) | ±(0.8+|0.2H|/100)μm | ||
salvage value contour | ≤0.005μm | ||
Error value | ≤±(5nm+0.1A) | ||
Indication repeatability | ≤±3% | ||
X axis | straightness | 0.6μm /100mm | |
resolution | 0.01μm | ||
sensor | type | Grating sensor | |
resolution | 0.01μm | ||
Evaluate length | λc×3、4、5、6、7 | ||
Cutoff wavelength | 0.025、0.08、0.25、0.8、2.5、8mm | ||
Motion control | Speed of rail movement | 0.02mm–4.0mm/s | |
Measurement speed | 0.02mm– 4.0mm/s |