Descrição

Testador de rugosidade de bancada MMD-SV100,Analisador de rugosidade superficial

Principle of instrumental

The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.

Measurement functions

Roughness analysis: Ra, Rq, Rz, Rp, Rt, Rsk, Rsm, Rc, Rz(DE), R3z, Rz(ELE), Rpmax

Rpm, Rku, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2

Rx, AR, Rpc, Rmax, RZ-ISO, 4um, Ry

Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, C, Wx, Wz, Wsm, Wdc, Wte

Wmr, Aw, C(Wmr), Wmr(C), Wdq/W△q

Original contour analysis: Ponto, Pai, Pp, Pv, Pq, Pc, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(C), Pz

The Pmr, C (Pmr)

Testador de rugosidade de bancada MMD-SV100,Analisador de rugosidade superficial

Especificação técnica

ItemEspecificação
Faixa de mediçãoX axis driver100milímetros
Z1(sensor)

Roughness and contour sharing

15milímetros
Column height400milímetros
Measure accuracyX Axis

(L=X axis Moving guide distance)

±(0.8+0.2L/100)μm
Z1 Axis

(H=Z1 axisd direction measure height)

±(0.8+|0.2H|/100)μm
salvage value contour≤0.005μm
Error value≤±(5nm+0.1A)
Indication repeatability≤±3%
Eixo Xstraightness0.6μm /100mm
resolução0.01μm
sensortipoGrating sensor
resolução0.01μm
Evaluate lengthλc×3、4、5、6、7
Cutoff wavelength0.025、0.08、0.25、0.8、2.5、8milímetros
Motion controlSpeed of rail movement0.02milímetros–4.0mm/s
Measurement speed0.02milímetros– 4.0mm/s






    Foi adicionado ao seu carrinho:
    Confira