Опис

ММД-СВ100 Стони тестер храпавости,Анализатор храпавости површине

Principle of instrumental

The instrument is cartesian coordinate measuring method, stylus contact type. Axis X uses high-precision linear guide rail as the benchmark, axis Z1 uses digital sensor to map the coordinate points of the surface contour shape of the measured parts, and carries out mathematical operation and processing on the original data collected by the sensor through computer software to mark the required measurement items.

Measurement functions

Roughness analysis: Ра, Рк, Рз, Рп, Рт, Рс, Рсм, Rc, Рз(DIN), Р3з, Рз(ОН), Rpmax

Rpm, Рку, Rdq/R△q, RδC, Mr1, Mr2, Rpk, Rvk, Rk, Rdc, A1, A2

Рк, AR, Rpc, Рмак, RZ-ISO, 4један, Ри

Ripple analysis: Wt, Wa, Wp, Wv, Wq, Wc, Wku, Wsk, В, Wx, Wz, Wsm, Wdc, Wte

Wmr, Aw, Ц(Wmr), Wmr(Ц), Wdq/W△q

Original contour analysis: Пт, Па, Pp, Pv, Pq, Pc, Pku, Psk, Pdq/ P-Q, Psm, Pdc, Pmr(Ц), Pz

The Pmr, Ц (Pmr)

ММД-СВ100 Стони тестер храпавости,Анализатор храпавости површине

Техничка спецификација

СтавкаСпецификација
Measure rangeX axis driver100мм
Z1(sensor)

Roughness and contour sharing

15мм
Column height400мм
Измерите тачностX Axis

(L=X axis Moving guide distance)

±(0.8+0.2L/100)μм
Z1 Axis

(H=Z1 axisd direction measure height)

±(0.8+|0.2Х|/100)μм
salvage value contour≤0.005μm
Error value≤±(5nm+0.1A)
Indication repeatability≤±3%
Кс осаstraightness0.6μm /100mm
resolution0.01μм
sensorтипGrating sensor
resolution0.01μм
Evaluate lengthλc×3、4、5、6、7
Cutoff wavelength0.025、0.08、0.25、0.8、2.5、8мм
Motion controlSpeed of rail movement0.02мм–4.0мм/с
Measurement speed0.02мм– 4.0мм/с






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