IP2X Test finger B

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The Standard Test Finger Probe meets the standards of IEC 60529, which is used for simulating the arm in the IP test. It is mainly used for IP grade test of the first characteristic number 2, and additional letter B project’s test. In the testing requirements of preventing from approaching to the hazardous parts, probe B needs 10N±3N thrust. For Other requirements, please refer to the following standards.

ตาม :IEC60065, ไออีซี 60335-1, ไออีซี 60529, IEC60884-1, IEC60950, IEC61032, IEC69

แอปพลิเคชัน:
1, The joint part of The Standard Test Knurled Finger Probe can’t touch the live parts or close to the dangerous parts, และ 50 mm to 20 mm baffle plate cannot enter.
2, In the prevent electric shock test, wires , power devices, and lighting devices are needed.
3,Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance

บันทึก 1:Using the pin and groove solution is only one of the possible approaches in order to limit the bending angle to 90°. สำหรับเหตุผลนี้, dimensions and tolerances of these details are not given in the drawing. The actual design must insure a 90° bending angle with a 0° to + 10° tolerance.
บันทึก 2: Dimensions in parentheses are for information only.
บันทึก 3: The test finger is taken from IEC 60950-1, Figure 2A. That test finger is based on IEC 6103216), Figure 2,test probe B. ในบางกรณี, the tolerances are different.