Portable X-ray fluorescence spectrometer Compass300 rapid analysis dust in primary and secondary elements
Using powder tabletting Compass – 300 – X ray fluorescence spectrometer on dust samples P, TiV, Ni, Cu, zinc, Ga, Rb, Sr, Nb, Cs and Ba, La, Hf, Zr, Pb, AI2O3, CaO, Fe2O3, K2O, MgO style, Na2O, amount of SiO2, such as primary and secondary component were determined and optimized the spectral lines, were using the experience coefficient method and the Compton scattering line as internal standard calibration matrix effect validated with national standard substances measured value and standard value Operator, can meet the demand of customer tests
Portable X-ray fluorescence spectrometer Compass300 rapid analysis dust in primary and secondary elements