ASTM D 1400-2000 “Non-Destructive Measurement of Dry Film Thickness of Non-Conductive Coatings Applied to Non-ferrous Metal Substrates”
1.1 The test method consists of a non-destructive measurement of the dry film thickness of a non-conductive coating applied to a non-ferrous metal substrate using a commercially available eddy current instrument. The test method is intended to complement the manufacturer’s instructions for the manual operation of the gauges, not to replace them.
1.2 This test method is not applicable to coatings that are prone to deform under the load of the measuring instrument because the instrument probe needs to be placed directly on the surface of the coating to take the reading.
1.3 Values expressed in SI units shall be regarded as standards. The values given in parentheses are for reference only.
1.4 This standard is not intended to address all safety issues, if any, associated with its use. It is the responsibility of users of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory restrictions prior to use.